What does a ToF-SIMS do?
ToF-SIMS is an imaging mass spectrometry (MS) technique that allows us to obtain isotopic, elemental, and molecular information from the surface of solid samples.
How do you read ToF on SIMS spectra?
TOF-SIMS spectra are typically displayed as a plot of signal intensity or ion counts on the Y-axis versus m/z on the X-axis. The height of a signal is proportional to the amount of that ion present in the spectrum and the m/z of the ion is basically the mass of that ion (if it is singly charged).
Is Sims a destructive technique justify your answer?
SIMS Depth Profiling Since the SIMS technique itself relies upon the removal of atoms from the surface, it is by its very nature a destructive technique, but also, ideally suited for depth profiling applications.
How does static SIMS instrumentally differ from dynamic Sims?
Static SIMS is the process involved in surface atomic monolayer analysis, or surface molecular analysis, usually with a pulsed ion beam and a time of flight mass spectrometer, while dynamic SIMS is the process involved in bulk analysis, closely related to the sputtering process, using a DC primary ion beam and a …
What is ToF analysis?
Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) is a surface-sensitive analytical method that uses a pulsed ion beam (Cs or microfocused Ga) to remove molecules from the very outermost surface of the sample. The particles are removed from atomic monolayers on the surface (secondary ions).
What does MALDI-TOF measure?
During MALDI-TOF analysis, the m/z ratio of an ion is measured by determining the time required for it to travel the length of the flight tube. A few TOF analyzers incorporate an ion mirror at the rear end of the flight tube, which serves to reflect back ions through the flight tube to a detector.
Can SIMS detect isotopes?
“Conventional” SIMS instruments mostly use large radius magnetic sectors nowadays. They have a lateral resolution of a few µm and can detect simultaneously up to five isotopes in a small mass range. They are usually used for high precision spot analyses of isotopes with a precision reaching 0.1‰.
What is the difference between TOF-SIMS and SIMS?
SIMS (Secondary Ion Mass Spectrometry) and TOF-SIMS (Time of Flight-SIMS) are the same in terms of mass analysis of secondary ions emitted by primary ion beam bombardment. It is also called static SIMS because there is so little sputtering (<0.1% of a monolayer) during data acquisition that the surface is “static”.